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Beilstein Arch. 2024, 202434. https://doi.org/10.3762/bxiv.2024.34.v1
Published 03 Jun 2024
Atomic force microscopy (AFM) serves as a versatile tool widely employed for the micro- and nanoscale characterization of materials, offering valuable insights into their morphology and physical properties. Despite the proposal of numerous new AFM technologies each year, engineers and researchers encounter a primary challenge in the efficient external acquisition of data and subsequent image reconstruction. Additionally, most AFM users are constrained to analyzing images provided by commercial scanning probe microscopes. However, by acquiring real raw data from the AFM, comprehensive studies of topography and physical properties become feasible. This paper presents a comprehensive guide to external data capture using data acquisition cards and image reconstruction for topographical and physical properties analysis. Furthermore, open-source programs for data acquisition and analysis (AFMDAQ Visualizer) have been developed with a specific focus on advancing external modes in AFM. The discussion encompasses key methodologies and essential tools aimed at enhancing AFM capabilities across diverse research applications.
Keywords: Atomic Force Microscopy, image, Acquisition data card, raw data.
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Fernandez Brito, D.; Murillo Bracamontes, E. A.; Enriquez Flores, C. I.; Gervacio Arciniega, J. J. Beilstein Arch. 2024, 202434. doi:10.3762/bxiv.2024.34.v1
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